Electron Microscope Specimen Mounts and Holders
Enterprise Technology Solutions Printable Tickets With Stubs
Printable Tickets with Tear-Away Stubs 97 Bright 65 lb Cover Weight 8 5 x 11 White 10 Tickets/Sheet 50 Sheets/Pack
Structure Probe Inc SPECIMEN STORAGE BOX AMRAY
SPI-Dry Specimen Storage Box for AMRAY SEM Pin-Type and JEOL 3/8in. round mount/holds 12 mounts
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 18 mm Head with 8 mm Pin, Aluminum, 3.2 mm Pin diameter
Pin stub mount with slotted head for use with Cambridge, Leica, ZEISS/LEO, FEI/Philips, PHENOM, CamScan, and Tescan.
Head: 18 mm
Pin height: 8 mm
Electron Microscopy Sciences SEM Hitachi S-450 M4 Mount 3-Division 5/8", 1/4" height, Aluminum
Hitachi S-450 SEM mounts with M4 tapered hole and female thread. With 3 divisions. Made from ultra-pure aluminum with standard lathe finish.
Head: 5/8"
Height: 1/4"
Electron Microscopy Sciences Multi Pin Holder 45 degree for 3 pin stubs
This 25.4 mm in diameter 45 Degree multi pin holder is designed to save time. It allows for a higher SE signal without having to tilt the specimen It is made from machined aluminum with stainless steel Allen set screws. It accommodates up to three standard 12.7 mm (1/2") pin stubs with 3.2 mm (1/8") pin.
Electron Microscopy Sciences Multi Holder Multi Holder for 6 Pin Stubs, Hitachi M4
This 42 mm in diameter multi pin holder is designed to save time It is made from machined aluminum with stainless steel set screws. It accommodates up to six standard 12.7 mm (1/2") pin stubs with 3.2 mm (1/8") pin.
Type: Hitachi M4
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 13/16"
Electron Microscopy Sciences Calibration Specimen 300-2D, SEM Pin
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: SEM Pin